Integrated circuit technology characterization and evaluation using automated CAD tool

Abstract In this paper an automated CAD tool that can be used in integrated circuit technology characterization is proposed. The proposed methodology fills the gap found in old, as well as, new IC design methodologies. The tool allows the user to perform a rapid and full characterization for different device models available in a process design kit (PDK). A set of pre-defined suite of test-benches are created to cover different aspects of circuit design. A seamless integration of the tool in typical design environments is achieved using SKILL code and OCEAN script. Moreover, the tool can compare different PDK releases or different technologies in terms of DC/AC performance, high frequency operation, leakage, and layout area efficiency. The paper presents the tool structure, interface, and capabilities. Finally, a characterization example is applied to CMOS 130 nm technology; results are shown for different devices characterization: MOSFET, BJT, Diode, Resistor, and Capacitor.