A comprehensive study of the application of the EOP techniques on bipolar devices
暂无分享,去创建一个
Philippe Perdu | Dean Lewis | Kevin Sanchez | Frédéric Darracq | Jean-Paul Guillet | Mohamed Mehdi Rebaï | Elise Bernou
[1] P. Perdu,et al. Optical probing (EOFM / TRI): A large set of complementary applications for ultimate VLSI , 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
[2] C. Boit,et al. Quantitative Investigation of Laser Beam Modulation in Electrically Active Devices as Used in Laser Voltage Probing , 2007, IEEE Transactions on Device and Materials Reliability.
[3] Ulrike Kindereit,et al. Investigation of laser-beam modulations induced by the operation of electronic devices , 2009 .
[4] H. K. Heinrich,et al. Measurement of real-time digital signals in a silicon bipolar junction transistor using a noninvasive optical probe , 1986 .
[5] Christian Boit,et al. Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology , 2008, Microelectron. Reliab..