论文信息 - Assessment of Active Dopants and p-n Junction Abruptness Using In Situ Biased 4D-STEM. - 字舞流文

Assessment of Active Dopants and p-n Junction Abruptness Using In Situ Biased 4D-STEM.

E. Monroy | H. Okuno | J. Rouviere | M. D. den Hertog | D. Cooper | Zahra Sadre Momtaz | B. C. da Silva | Z. Sadre Momtaz