Flip-chip mounted 26 V GaInP/GaAs power HBTs
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H. Blanck | W. Heinrich | W. Doser | P. Heymann | P. Auxemery | T. Bergunde | P. Kurpas | F. Schnieder | T. Grasshoff | B. Janke | J. Wurfl | M. Neuner | A. Maassdorf
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[3] Frank Brunner,et al. Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing , 2001, Microelectron. Reliab..