Simulation Evaluation of an Implemented Set of Complementary Bulk Built-In Current Sensors With Dynamic Storage Cell

This paper describes the design, the physical implementation, and the test procedure for a complementary pair of bulk built-in current sensors (Bulk-BICS) circuits, intended to detect single-event transients (SETs) induced by ionizing radiation on n- and p-type metal-oxide-semiconductor transistors. Electrical characterization of the prototype chip was performed, and the results are presented here. While not subjected to actual ionizing radiation, the performance of the manufactured integrated circuit is evaluated from its response to electrical test signals.

[1]  M. Nicolaidis,et al.  Evaluation of a soft error tolerance technique based on time and/or space redundancy , 2000, Proceedings 13th Symposium on Integrated Circuits and Systems Design (Cat. No.PR00843).

[2]  A. Simionovski,et al.  A Bulk Built-in Current Sensor for SET detection with dynamic memory cell , 2012, 2012 IEEE 3rd Latin American Symposium on Circuits and Systems (LASCAS).

[3]  G. Wirth,et al.  The Bulk Built In Current Sensor Approach for Single Event Transient Detection , 2007, 2007 International Symposium on System-on-Chip.

[4]  M. Nicolaidis,et al.  Design for soft error mitigation , 2005, IEEE Transactions on Device and Materials Reliability.

[5]  peixiong zhao,et al.  Reliability and radiation effects in IC technologies , 2008, 2008 IEEE International Reliability Physics Symposium.

[6]  G. Niu,et al.  The impact of substrate bias on proton damage in 130 nm CMOS technology , 2005, IEEE Radiation Effects Data Workshop, 2005..

[7]  F.L. Kastensmidt,et al.  Tbulk-BICS: A Built-In Current Sensor Robust to Process and Temperature Variations for Soft Error Detection , 2008, IEEE Transactions on Nuclear Science.

[8]  Luigi Carro,et al.  Using built-in sensors to cope with long duration transient faults in future technologies , 2007, 2007 IEEE International Test Conference.

[9]  G. C. Messenger,et al.  Collection of Charge on Junction Nodes from Ion Tracks , 1982, IEEE Transactions on Nuclear Science.

[10]  Tao Wang,et al.  A new Bulk Built-In Current Sensing circuit for single-event transient detection , 2010, CCECE 2010.

[11]  Michael Nicolaidis,et al.  SEU-tolerant SRAM design based on current monitoring , 1994, Proceedings of IEEE 24th International Symposium on Fault- Tolerant Computing.

[12]  Fernanda Gusmão de Lima Kastensmidt,et al.  Using Bulk Built-in Current Sensors to Detect Soft Errors , 2006, IEEE Micro.