Photometric Redshifts in the W-CDF-S and ELAIS-S1 Fields Based on Forced Photometry from 0.36 to 4.5 Microns
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M. Radovich | W. Brandt | M. Paolillo | N. Napolitano | G. Covone | M. Vaccari | M. Spavone | F. Bauer | M. Lacy | K. Nyland | Q. Ni | F. Zou | Guang Yang