Examination of Si1-xGex Laterally Graded Crystals for Use in High Brilliance Synchrotron Beams
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S. N. Rossolenko | N. Abrosimov | F. Schäfers | A. Erko | W. Gudat | M. Veldkamp | V. Alex | V. Shekhtman | E. Shulakov | S. Khasanov | I. Smirnova