Detecting Single Event Upsets in Embedded Software

The past decade has seen explosive growth in the use of small satellites. Within this domain, there has been a growing trend to place more responsibility on the flight software (versus hardware) and an increasing adoption of consumer-grade microprocessors to satisfy this desire for increased processing capability while still minimizing size, weight, and power parameters. These consumer-grade processors, however, are more susceptible to cosmic radiation and the occurrence of single event upsets. In this paper, we examine software-centric checks to detect the occurrence of such upset events in modern microprocessors.

[1]  Oliver Quinlan,et al.  Astro Pi: Running your code aboard the International Space Station , 2017 .

[2]  Christopher P. Bridges,et al.  Improvements in CPU & FPGA Performance for Small Satellite SDR Applications , 2017, IEEE Transactions on Aerospace and Electronic Systems.

[3]  Tushar Sharma,et al.  SRMSAT: A Feasibility Study on Small Satellite Mission to Moon , 2016 .

[4]  Massimo Violante,et al.  Software and Hardware Techniques for SEU Detection in IP Processors , 2008, J. Electron. Test..

[5]  F. Faure,et al.  How to characterize the problem of SEU in processors & representative errors observed on flight , 2005, 11th IEEE International On-Line Testing Symposium.

[6]  R. Koga,et al.  Techniques of Microprocessor Testing and SEU-Rate Prediction , 1985, IEEE Transactions on Nuclear Science.

[7]  Craig Underwood,et al.  Observed radiation-induced degradation of commercial-off-the-shelf (COTS) devices operating in low-Earth orbit , 1998 .

[8]  Margaret B. Alexander,et al.  Spacecraft System Failures and Anomalies Attributed to the Natural Space Environment , 1995 .

[9]  K.A. LaBel,et al.  Commercial microelectronics technologies for applications in the satellite radiation environment , 1996, 1996 IEEE Aerospace Applications Conference. Proceedings.

[10]  Alessandro Golkar,et al.  CubeSat evolution: Analyzing CubeSat capabilities for conducting science missions , 2017 .

[11]  S. M. Marcus,et al.  Minimum Size and Maximum Packing Density of Nonredundant Semiconductor Devices , 1962, Proceedings of the IRE.

[12]  Peter Hazucha,et al.  Characterization of soft errors caused by single event upsets in CMOS processes , 2004, IEEE Transactions on Dependable and Secure Computing.

[13]  A. Menicucci,et al.  Roadmap for On-Board Processing and Data Handling Systems in Space , 2018 .

[14]  Bogdan Nicolescu,et al.  Detecting Soft Errors by a Purely Software Approach: Method, Tools and Experimental Results , 2003, DATE.

[15]  Rainer Sandau.  Implications of new trends in small satellite development , 2011 .

[16]  Y. Savaria,et al.  Software detection mechanisms providing full coverage against single bit-flip faults , 2004, IEEE Transactions on Nuclear Science.

[17]  P. M. O'Neill,et al.  Single event upsets for Space Shuttle flights of new general purpose computer memory devices , 1994 .

[18]  G. M. Swift,et al.  In-flight observations of multiple-bit upset in DRAMs , 2000 .

[19]  L. D. Akers.  Microprocessor Technology and Single Event Upset Susceptibility , 1996 .

[20]  Massimo Violante,et al.  Soft-error detection using control flow assertions , 2003, Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI Systems.