Chapter 4 Electro-Optic Measurement Techniques for Picosecond Materials, Devices, and Integrated Circuits

Publisher Summary This chapter discusses the electro-optic measurement techniques for picosecond materials, devices, and integrated circuits. It describes the fastest of the current optical techniques available, electro-optic sampling. Electro-optic sampling uses electro-optic crystals as the electrical signal sensor. In this system, optical pulses interact directly with the electrical signal via the electro-optic effect. As such, it is an all-optical technique and is one of the simplest ways to exploit the availability of picosecond optical pulses directly as sampling gates. The most significant advantages of the electro-optic measuring techniques are high temporal resolution and flexibility. The applications of electro-optic measuring include the measurement of single devices, such as the 5.4-ps permeable base transistor (PBT); the characterization of transmission lines, the internal probing of GaAs integrated circuits, and InP circuits; the cryogenic measurement of superconducting devices and materials; the external probing of devices and integrated circuits; and even the detection of freely propagating terahertz radiation pulses. The flexibility is attributed to the simple mechanism on which the technique is based that is the electro-optic or Pockels effect, where the optical properties (birefringence) of a crystal change when an electric field is applied across it.

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