Study of enhancement test and limit criterion determining method for Inertial navigation products

Due to the influences of time and external environment, key parameters of Inertial navigation products are led into drift, which influence the storage life and reliability of inertial navigation products. The enhancement experiment is one of the most important taches and content in accelerated test technology. It is conducted to rapidly challenge the potential defects in the product design by applying far more environmental and working stress than the design specification to the specimen, and then defects would be reflected in fault types. According to the analysis of influence factors to parameters' drift, the storage data over the years and exist storage profile, temperature and vibration are the main factors in storage process for accelerometer. Therefore, the enhancement test is consisted of low temperature step-stress test, high temperature step-stress test, rapid temperature change cycling test and vibration step-stress test. After the enhancement tests are implemented, the latent fault mechanism and the fault location are integratedly given. Finally, a kind of determining method for the limit based on mechanism invariability is advanced; at the same time, the operating limit, damage limit and other quantitative parameters to corresponding stress are obtained. That will help engineers to know the performance of the accelerometer and undergo the accelerated degradation test.

[1]  Dong Li Reliability Enhancement Test of the Space-borne Rubidium Atomic Frequency Standard , 2005 .

[2]  J. Marshall,et al.  Comparison of reliability enhancement tests for electronic equipment , 2003, Annual Reliability and Maintainability Symposium, 2003..

[3]  Wang Cheng Study of the identification for the static temperature model and the method for compensating temperature of the accelerometer , 2007 .

[4]  Makoto Ishida,et al.  Low temperature dependence three-axis accelerometer for high temperature environments with temperature control of SOI piezoresistors , 2003 .

[5]  R. W. Deppe,et al.  Reliability Enhancement Testing (RET) , 1994, Proceedings of Annual Reliability and Maintainability Symposium (RAMS).

[6]  Jiang Tong-min Reliability Enhancement Testing Technology for Safe Acceleration Range , 2010 .

[7]  M. Ishida,et al.  Improvement of thermal response in temperature controlled precise three-axis accelerometer with stabilized characteristics over a wide temperature range , 2005, The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05..

[8]  M.K. Chengalva,et al.  Simplified Highly-Accelerated Life Testing on components for product-level vibration reliability enhancement , 2004, The Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena In Electronic Systems (IEEE Cat. No.04CH37543).

[9]  Feng Shun-shan Analysis of Zero Drift of the Acceleration Sensor in High-Impulsion and High Overloading , 2004 .

[10]  D. Campbell,et al.  Analysis of vibration effects on mobile missile systems , 1988 .

[11]  Zhang Peng-fei Research on Compensating Error Model of Quartzose Flexible Accelerometer , 2006 .