Universal closed-form expressions for the inductance of tapered through silicon vias (T-TSVs) based on vector magnetic potential

This paper proposes novel formulas for the calculation of the parasitic inductance of Tapered-Through Silicon Vias (T-TSVs), considering the TSVs located in adjacent layers. The formulas can not only be reduced to calculate the self-partial inductance and mutual-partial inductance of T-TSVs located in the same layer but also be used for cylindrical TSVs when the slope angle is 90°. The comparison between the results of the proposed formulas and Ansoft Q3D shows that the proposed formulas have very high accuracy with a maximum error of 2.5%.

[1]  R. Suaya,et al.  Compact AC Modeling and Performance Analysis of Through-Silicon Vias in 3-D ICs , 2010, IEEE Transactions on Electron Devices.

[2]  R. Tummala,et al.  Rigorous Electrical Modeling of Through Silicon Vias (TSVs) With MOS Capacitance Effects , 2011, IEEE Transactions on Components, Packaging and Manufacturing Technology.

[3]  Dongwook Kim,et al.  Interposer design optimization for high frequency signal transmission in passive and active interposer using through silicon via (TSV) , 2011, 2011 IEEE 61st Electronic Components and Technology Conference (ECTC).

[4]  Yintang Yang,et al.  Parasitic Inductance of Non-Uniform Through-Silicon Vias (TSVs) for Microwave Applications , 2015, IEEE Microwave and Wireless Components Letters.

[5]  W. Dehaene,et al.  Electrical Modeling and Characterization of Through Silicon via for Three-Dimensional ICs , 2010, IEEE Transactions on Electron Devices.

[6]  Ankur Jain,et al.  Electrical modeling and characterization of through-silicon vias (TSVs) for 3-D integrated circuits , 2008, Microelectron. J..

[7]  Bing-Zhong Wang,et al.  Wideband Impedance Model for Coaxial Through-Silicon Vias in 3-D Integration , 2013, IEEE Transactions on Electron Devices.

[8]  E. Friedman,et al.  Closed-Form Expressions of 3-D Via Resistance, Inductance, and Capacitance , 2009, IEEE Transactions on Electron Devices.

[9]  R. Suaya,et al.  A Fully Analytical Model for the Series Impedance of Through-Silicon Vias With Consideration of Substrate Effects and Coupling With Horizontal Interconnects , 2011, IEEE Transactions on Electron Devices.

[10]  C. Paul Inductance: Loop and Partial , 2009 .

[11]  Ye Li,et al.  Closed-Form Expressions for the Resistance and the Inductance of Different Profiles of Through-Silicon Vias , 2011, IEEE Electron Device Letters.

[12]  Sung Kyu Lim,et al.  Study of Through-Silicon-Via Impact on the 3-D Stacked IC Layout , 2013, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[13]  Joungho Kim,et al.  High Frequency Electrical Model of Through Wafer Via for 3-D Stacked Chip Packaging , 2006, 2006 1st Electronic Systemintegration Technology Conference.

[14]  Mao Junfa,et al.  An accurate RLGC circuit model for dual tapered TSV structure , 2014 .

[15]  M. Swaminathan,et al.  Electromagnetic modeling of non-uniform through-silicon via (TSV) interconnections , 2012, 2012 IEEE 16th Workshop on Signal and Power Integrity (SPI).