Avalanche Breakdown Delay in ESD Protection Diodes
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Dionyz Pogany | Erich Gornik | Matthias Stecher | Joost Willemen | David Johnsson | D. Pogany | E. Gornik | M. Stecher | D. Johnsson | J. Willemen
[1] O. Awadelkarim,et al. Deep‐level transient spectroscopy and photoluminescence studies of electron‐irradiated Czochralski silicon , 1986 .
[2] A. G. Chynoweth,et al. Effect of Dislocations on Breakdown in Silicon p-n Junctions , 1958 .
[3] E. Pincik,et al. EVIDENCE FOR THE IMPROVED DEFECT-POOL MODEL FOR GAP STATES IN AMORPHOUS SILICON FROM CHARGE DLTS EXPERIMENTS ON UNDOPED A-SI:H , 1997 .
[4] C. Jagadish,et al. Generation rate of point defects in silicon irradiated by MeV ions , 1993 .
[5] M. Sawada,et al. Extreme voltage and current overshoots in HV snapback devices during HBM ESD stress , 2008, EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.
[6] S. M. Sze,et al. Physics of semiconductor devices , 1969 .
[7] I. V. Grekhov,et al. Tunneling-assisted impact ionization fronts in semiconductors , 2001 .
[8] M. Stecher,et al. Avalanche Breakdown Delay in High-Voltage p-n Junctions Caused by Pre-Pulse Voltage From IEC 61000-4-2 ESD Generators , 2009, IEEE Transactions on Device and Materials Reliability.
[9] E. Worley,et al. Pre Pulse Voltage in the Human Body Model , 2006, 2006 Electrical Overstress/Electrostatic Discharge Symposium.
[10] K. Mckay. Avalanche Breakdown in Silicon , 1954 .
[11] M. Stecher,et al. ESD protection considerations in advanced high-voltage technologies for automotive , 2006, 2006 Electrical Overstress/Electrostatic Discharge Symposium.
[12] R. J. McIntyre,et al. Theory of Microplasma Instability in Silicon , 1961 .
[13] G. Groeseneken,et al. Characterization and modeling of transient device behavior under CDM ESD stress , 2004, 2003 Electrical Overstress/Electrostatic Discharge Symposium.
[14] D. Lang. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors , 1974 .
[15] T. Meuse,et al. Voltages before and after HBM stress and their effect on dynamically triggered power supply clamps , 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.