论文信息 - Electrical Characterization of $\hbox{ZrO}_{2}/\hbox{Si}$ Interface Properties in MOSFETs With $\hbox{ZrO}_{2}$ Gate Dielectrics - 字舞流文

Electrical Characterization of $\hbox{ZrO}_{2}/\hbox{Si}$ Interface Properties in MOSFETs With $\hbox{ZrO}_{2}$ Gate Dielectrics