NBTI-Induced Delay Degradation Analysis of FPGA Routing Structures
暂无分享,去创建一个
[1] N. Collaert,et al. Disorder-controlled-kinetics model for negative bias temperature instability and its experimental verification , 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
[2] Jōhō Shori Gakkai,et al. IPSJ Transactions on system LSI design methodology , 2008 .
[3] Chen Wei Tseng,et al. SEU-Susceptibility of Logical Constants in Xilinx FPGA Designs , 2009, IEEE Transactions on Nuclear Science.
[4] Peter Y. K. Cheung,et al. Fault tolerant methods for reliability in FPGAs , 2008, 2008 International Conference on Field Programmable Logic and Applications.
[5] Vaughn Betz,et al. The stratixπ routing and logic architecture , 2003, FPGA '03.
[6] Yu Cao,et al. The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis , 2010, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[7] Peter Y. K. Cheung,et al. Degradation in FPGAs: measurement and modelling , 2010, FPGA '10.
[8] Yu Cao,et al. The Impact of NBTI on the Performance of Combinational and Sequential Circuits , 2007, 2007 44th ACM/IEEE Design Automation Conference.
[9] Yu Cao,et al. Predictive Modeling of the NBTI Effect for Reliable Design , 2006, IEEE Custom Integrated Circuits Conference 2006.
[10] Kazutoshi Kobayashi,et al. Evaluation of FPGA design guardband caused by inhomogeneous NBTI degradation considering process variations , 2010, 2010 International Conference on Field-Programmable Technology.
[11] VrudhulaSarma,et al. The impact of NBTI effect on combinational circuit , 2010 .
[12] David Harris,et al. CMOS VLSI Design: A Circuits and Systems Perspective , 2004 .
[13] Michael J. Wirthlin,et al. SEU mitigation for half-latches in Xilinx Virtex FPGAs , 2003 .
[14] V. Huard,et al. On-the-fly characterization of NBTI in ultra-thin gate oxide PMOSFET's , 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
[15] Narayanan Vijaykrishnan,et al. Impact of NBTI on FPGAs , 2007, 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07).
[16] A. S. Grove,et al. Characteristics of the Surface‐State Charge (Qss) of Thermally Oxidized Silicon , 1967 .
[17] H. Reisinger,et al. Analysis of NBTI Degradation- and Recovery-Behavior Based on Ultra Fast VT-Measurements , 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.
[18] S. Mahapatra,et al. On the differences between ultra-fast NBTI measurements and Reaction-Diffusion theory , 2009, 2009 IEEE International Electron Devices Meeting (IEDM).
[19] Carl Carmichael,et al. Triple Module Redundancy Design Techniques for Virtex FPGAs, Application Note 197 , 2001 .