Bulk built in current sensors for single event transient detection in deep-submicron technologies

As device dimensions are scaled down, single event transients (SET) are increasingly affecting the reliability of integrated circuits. An SET is a transient voltage perturbation caused by an energetic particle strike at the semiconductor. This work studies the applicability of bulk built in current sensors (bulk-BICS) for SET detection in deep-submicron technologies. The bulk-BICS detects the transient current generated by the impact of an energetic particle at a sensitive circuit node. The efficiency and applicability of this approach to SET detection is demonstrated through device and circuit level simulations.

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