Transmission phase gratings for EUV interferometry.
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J. Bokor | E. Gullikson | P. Naulleau | C H Cho | J Bokor | C. Cho | P P Naulleau | E M Gullikson
[1] B. L. Henke,et al. X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92 , 1993 .
[2] A. A. MacDowell,et al. Phase‐measuring interferometry using extreme ultraviolet radiation , 1995 .
[3] S. H. Lee,et al. Extreme-ultraviolet phase-shifting point-diffraction interferometer: a wave-front metrology tool with subangstrom reference-wave accuracy. , 1999, Applied optics.
[4] Kenneth A. Goldberg,et al. At-wavelength interferometry for extreme ultraviolet lithography , 1997 .
[5] Eric M. Gullikson,et al. Multilayer‐coated echelle gratings for soft x rays and extreme ultraviolet , 1995 .
[6] Donald M. Tennant,et al. Alignment of a multilayer‐coated imaging system using extreme ultraviolet Foucault and Ronchi interferometric testing , 1995 .