Computing optimal test sequences from complete test sets for stuck-open faults in CMOS circuits

A sequence of input vectors which detects all transistor stuck-open faults in a CMOS combinational circuit is a complete test sequence. Given a complete set of two-pattern tests for transistor stuck-open faults in a CMOS circuit, it is shown that a complete test sequence of minimum length can be obtained efficiently. A precise description of this problem and examples to illustrate the method are presented. >

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