Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometry.

A new method for measuring the refractive index is presented. First, the phase difference between s and p polarizations that is due to the total internal reflection is measured by heterodyne interferometry. Then, substituting this phase difference into the Fresnel equations, we can obtain the refractive index of the test medium.

[1]  Haiming Wang.  Determination of optical constants of absorbing crystalline thin films from reflectance and transmittance measurements with oblique incidence , 1994 .

[2]  S T Kirsch,et al.  Determining the refractive index and thickness of thin films from prism coupler measurements. , 1981, Applied optics.

[3]  K. Witt,et al.  Evaluation of optical properties of decorative coatings by spectroscopic ellipsometry , 1992 .

[4]  B E Paton,et al.  Precise thickness and refractive index determination of polyimide films using attenuated total reflection. , 1994, Applied optics.

[5]  K. Hieda,et al.  Use of a total absorption ATR method to measure complex refractive indices of metal-foils , 1980 .

[6]  G. Meeten,et al.  Critical-angle measurement of refractive index of absorbing materials: an experimental study , 1986 .

[7]  Soe-Mie F. Nee,et al.  Accurate null polarimetry for measuring the refractive index of transparent materials , 1993 .

[8]  Michael A. Player,et al.  Importance of rotational beam alignment in the generation of second harmonic errors in laser heterodyne interferometry , 1993 .

[9]  E. H. Linfoot.  Principles of Optics , 1961 .

[10]  H. Rigneault,et al.  Nonlinear totally reflecting prism coupler: thermomechanic effects and intensity-dependent refractive index of thin films. , 1995, Applied optics.

[11]  R. Azzam.  Simple and direct determination of complex refractive index and thickness of unsupported or embedded thin films by combined reflection and transmission ellipsometry at 45° angle of incidence , 1983 .

[12]  L H Shyu,et al.  Method for measuring the retardation of a wave plate. , 1993, Applied optics.

[13]  Makio Akimoto,et al.  Brewster and Pseudo-Brewster Angle Technique for Determination of Optical Constants , 1992 .

[14]  R Ulrich,et al.  Measurement of thin film parameters with a prism coupler. , 1973, Applied optics.

[15]  K. P. Birch,et al.  An Updated Edln Equation for the Refractive Index of Air , 1993 .