Silicon photomultiplier test system and test method

The invention discloses a silicon photomultiplier test system comprising a driver module, a light source module, a silicon photomultiplier unit, a camera bellows, a comparison circuit module, a power module, a logic analyzer, and a computer. In the test system, the driver module produces an analog pulse drive signal to drive the light source to produce optical pulse, and the optical pulse acts on the silicon photomultiplier unit as optical excitation to make each silicon photomultiplier produce an analog pulse response signal. An amplifier circuit module judges the amplitude of each analog pulse response signal so as to mark silicon photomultipliers capable of producing specific signal amplitude in the form of digital pulse. Digital pulse signals with mark information are converted and recorded by the logic analyzer and then transmitted to the computer, and then, corresponding data analysis and storage are performed. The test system of the invention has the advantages of simple structure, high efficiency, batch test, and the like, and can be easily used in large-scale test of silicon photomultiplier products. In addition, the invention discloses a test method for testing silicon photomultipliers using the test system.