Defect reduction in MBE-grown AlN by multicycle rapid thermal annealing
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Jordan D. Greenlee | K. Hobart | A. Koehler | T. Anderson | J. Greenlee | W. Doolittle | F. Kub | B. Feigelson | B. Gunning
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Jordan D. Greenlee | K. Hobart | A. Koehler | T. Anderson | J. Greenlee | W. Doolittle | F. Kub | B. Feigelson | B. Gunning