Lifetime Estimation of Insulated Gate Bipolar Transistor Modules Used for Industrial Application

[1]  K. V. V. S. B. S. R. Murthy,et al.  Transformation between Foster and Cauer equivalent networks , 1978 .

[2]  Frede Blaabjerg,et al.  An overview of the reliability prediction related aspects of high power IGBTs in wind power applications , 2011, Microelectron. Reliab..

[3]  Stig Munk-Nielsen,et al.  Lifetime investigation of high power IGBT modules , 2011, Proceedings of the 2011 14th European Conference on Power Electronics and Applications.

[4]  Paul A. Meehan,et al.  Equivalence of four-point and three-point rainflow cycle counting algorithms , 2008 .

[5]  Adam Niesłony,et al.  Determination of fragments of multiaxial service loading strongly influencing the fatigue of machine components , 2009 .

[6]  Kesheng Wang,et al.  Models for lifetime estimation: an overview with focus on applications to wind turbines , 2014 .

[7]  Yip-Wah Chung,et al.  Encyclopedia of tribology , 2013 .

[8]  Y. P. Obulesu,et al.  DESIGN AND SIMULATION OF DIRECT TORQUE CONTROL OF INDUCTION MOTOR DRIVE USING MATLAB/SIMULINK , 2007 .

[9]  U. Drofenik,et al.  New physical model for lifetime estimation of power modules , 2010, The 2010 International Power Electronics Conference - ECCE ASIA -.

[10]  Christopher Bailey,et al.  Mission Profile-Based Reliability Design and Real-Time Life Consumption Estimation in Power Electronics , 2015, IEEE Transactions on Power Electronics.

[11]  Dawei Xiang,et al.  An Industry-Based Survey of Reliability in Power Electronic Converters , 2011, IEEE Transactions on Industry Applications.

[12]  R. Cooke Experts in Uncertainty: Opinion and Subjective Probability in Science , 1991 .

[13]  S. Sze,et al.  Physics of Semiconductor Devices: Sze/Physics , 2006 .

[14]  H. Grubin The physics of semiconductor devices , 1979, IEEE Journal of Quantum Electronics.

[15]  Jane M. Booker,et al.  PREDICT: a case study, using fuzzy logic , 2003, Annual Reliability and Maintainability Symposium, 2003..

[16]  Frede Blaabjerg,et al.  Complete Loss and Thermal Model of Power Semiconductors Including Device Rating Information , 2015, IEEE Transactions on Power Electronics.

[18]  Noureddine Zerhouni,et al.  Framework for a distributed and hybrid prognostic system , 2007 .

[19]  Munaf Rahimo,et al.  The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination , 2016, Microelectron. Reliab..