论文信息 - Evaluating and expressing uncertainty in complex S-parameter measurements

Evaluating and expressing uncertainty in complex S-parameter measurements

This paper presents methods for evaluating and expressing the uncertainty associated with complex S-parameter measurements. The methods are based on internationally recommended guidelines [1] with extensions to accommodate the complex nature of the measurands. The treatment of measurements of both one-port and multi-port devices is presented.

Nick M. Ridler | Martin J. Salter | N. Ridler | M. Salter

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