A Radiation Hardened Nano-Power 8Mb SRAM in 130nm CMOS
暂无分享,去创建一个
Philippe Roche | Francois Jacquet | Mark Alan Lysinger | Mehdi Zamanian | N. Sahoo | J. Russell | David Charles Mcclure
[1] G. Gasiot,et al. Impacts of front-end and middle-end process modifications on terrestrial soft error rate , 2005, IEEE Transactions on Device and Materials Reliability.