Analysis and test system and test method for junction temperature of semiconductor lamp

The invention discloses an analysis and test system and a test method for the junction temperature of a semiconductor lamp. The system comprises a radiation power tester, an electrical parameter generating and measuring apparatus, a temperature tester, a variable-environment lamp test integrating sphere, a test reference point and light source module temperature distribution computing module, a light source module thermal resistance distribution and junction temperature computing module, a multi-working point optimization and analysis module and a central monitoring and processing computer. The test system provided by the invention can effectively test the junction temperature distribution of the lamp under conditions of normal working state of the semiconductor lamp and no damage to the structure of the lamp. The system is formed based on a concept that: the whole semiconductor lamp is used as an object of study, a proper part of a light module is used as a test reference point, and the junction temperature of the semiconductor lamp is analyzed by a method combining physical test, a numerical model, a physical model and computer thermal test.