An x-ray photoemission electron microscope using an electron mirror aberration corrector for the study of complex materials
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H. Padmore | S. Raoux | J. Stöhr | A. MacDowell | É. Forest | M. Marcus | R. Schlueter | P. Schmid | A. Scholl | Ying K. Wu | A. MacDowell | Jun Feng | W. Wan | Y. Wu | D. Robin | D. Wei | R. Schlueter | J. Feng | M. Marcus | A. Scholl