Application of Kernel C-Means Clustering and Dempster-Shafer Theory of evidence in power transformers fault diagnosis
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Xiaoyun Sun | Yongchun Liang | Donghui Liu | Jian-Peng Bian | Dandan Lv | Yongchun Liang | Xiaoyun Sun | Dandan Lv | Donghui Liu | J. Bian
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