论文信息 - The Measurement of Thin Film Thickness by Interferometry - 字舞流文

The Measurement of Thin Film Thickness by Interferometry

[1] L. Schulz. An Interferometric Method for Accurate Thickness Measurements of Thin Evaporated Films , 1950 .

[2] S. Tolansky,et al. High Intensity Reflection Interferometry for Weak Sources , 1949 .