Qubit metrology of ultralow phase noise using randomized benchmarking
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R. Barends | Yu Chen | J. Kelly | A. Megrant | P. O’Malley | D. Sank | A. Vainsencher | J. Wenner | T. White | A. Cleland | J. Martinis | A. Fowler | B. Campbell | Z. Chen | B. Chiaro | A. Dunsworth | E. Jeffrey | J. Mutus | C. Neill | C. Quintana | P. Roushan | Y. Chen | A. Korotkov | I. Hoi | B. Campbell
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