论文信息 - Growth of atomically smooth AlN films with a 5:4 coincidence interface on Si(111) by MBE - 字舞流文

Growth of atomically smooth AlN films with a 5:4 coincidence interface on Si(111) by MBE

W. Richter | J. Schulze | U. Kaiser | J. Kräusslich | A. Fissel | H. Schenk | G. Kipshidze | H. Hobert