Experimental Techniques

The proper understanding of the nanocluster carbon thin films requires a good understanding and analysis of the nanocluster carbon thin films. In this work, morphological, compositional, electrical and optical characterizations are involved. The morphological and compositional characterization helps us to understand the microstructure of the samples, the effects of various deposition parameters on film microstructure, and the growth mechanisms involved. Electrical properties of thin films are very important to ascertain the dominant conduction mechanism in the films. Capacitance–Voltage (CV) measurements have been used to measure the surface states, defect densities and dielectric constant of the films. Optical characterization helps in understanding the various optical transitions taking place in the films. Here, we discuss experimental set–ups require for morphological, compositional, electrical, electronic and optical studies of the nanocluster carbon (NC) thin films.