Detection of Anti-Counterfeiting Markers through Permittivity Maps Using a Micrometer Scale near Field Scanning Microwave Microscope
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Felipe L. Peñaranda-Foix | Pedro J. Plaza-González | Jose Manuel Catala-Civera | José D. Gutiérrez-Cano | Jose D. Gutiérrez-Cano | P. Plaza-González | F. Peñaranda-Foix | J. Catalá-Civera
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