Antirandom Testing: A Distance-Based Approach

Random testing requires each test to be selected randomly regardless of the tests previously applied. This paper introduces the concept of antirandom testing where each test applied is chosen such that its total distance from all previous tests is maximum. This spans the test vector space to the maximum extent possible for a given number of vectors. An algorithm for generating antirandom tests is presented. Compared with traditional pseudorandom testing, antirandom testing is found to be very effective when a high-fault coverage needs to be achieved with a limited number of test vectors. The superiority of the new approach is even more significant for testing bridging faults.

[1]  Richard W. Hamming,et al.  Error detecting and error correcting codes , 1950 .

[2]  Jacob Savir,et al.  Built In Test for VLSI: Pseudorandom Techniques , 1987 .

[3]  Yashwant K. Malaiya,et al.  Antirandom testing: getting the most out of black-box testing , 1995, Proceedings of Sixth International Symposium on Software Reliability Engineering. ISSRE'95.

[4]  Dhiraj K. Pradhan,et al.  A Hamming distance based test pattern generator with improved fault coverage , 2005, 11th IEEE International On-Line Testing Symposium.

[5]  Dhiraj K. Pradhan,et al.  Comparative study of CA with phase shifters and GLFSRs , 2005, IEEE International Conference on Test, 2005..

[6]  Yashwant K. Malaiya,et al.  The Coverage Problem for Random Testing , 1984, ITC.

[7]  Dhiraj K. Pradhan,et al.  GLFSR-a new test pattern generator for built-in-self-test , 1994, Proceedings., International Test Conference.

[8]  Santanu Chattopadhyay,et al.  Additive cellular automata : theory and applications , 1997 .

[9]  Santanu Chattopadhyay,et al.  Cellular Automata-Based Recursive Pseudoexhaustive Test Pattern Generator , 2001, IEEE Trans. Computers.

[10]  Yashwant K. Malaiya,et al.  Automatic test generation using checkpoint encoding and antirandom testing , 1997, Proceedings The Eighth International Symposium on Software Reliability Engineering.

[11]  Shiyi Xu,et al.  An efficient random-like testing , 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).

[12]  John A. Waicukauski,et al.  Fault detection effectiveness of weighted random patterns , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

[13]  Kewal K. Saluja,et al.  A Novel Approach to Random Pattern Testing of Sequential Circuits , 1998, IEEE Trans. Computers.

[14]  Sujit Dey,et al.  Software-based self-testing methodology for processor cores , 2001, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[15]  Sandeep K. Gupta,et al.  A methodology to design efficient BIST test pattern generators , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

[16]  Nur A. Touba,et al.  Altering a pseudo-random bit sequence for scan-based BIST , 1996, Proceedings International Test Conference 1996. Test and Design Validity.

[17]  Edward J. McCluskey,et al.  Pseudorandom Testing , 1987, IEEE Transactions on Computers.

[18]  Shiyi Xu,et al.  Maximum distance testing , 2002, Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02)..

[19]  Anneliese Amschler Andrews,et al.  Fast Anti-Random (FAR) Test Generation to Improve the Quality of Behavioral Model Verification , 2002, J. Electron. Test..

[20]  Anneliese Amschler Andrews,et al.  Fast antirandom (FAR) test generation , 1998, Proceedings Third IEEE International High-Assurance Systems Engineering Symposium (Cat. No.98EX231).

[21]  Anura P. Jayasumana,et al.  Antirandom vs. pseudorandom testing , 1998, Proceedings International Conference on Computer Design. VLSI in Computers and Processors (Cat. No.98CB36273).