论文信息 - 3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling. - 字舞流文

3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling.

M. Alexander | D. Scurr | A. Shard | R. Havelund | J. S. Sharp | I. Gilmore | J. Bailey