Preparation and comparison of YBa2Cu4O8 films on MgO(100) and SrTiO3(100) by MOCVD

The thin films (Y/Ba/Cu=1.0/2.7/4.7) which have a strong intensity corresponding to the c-axis peaks of the 124 phase (YBa2Cu4O8) in x-ray diffraction patterns were prepared. The film structure and the surface morphology of these films were observed by SEM, TEM, EDX and AFM. It was found that the film on MgO(100) clearly has grain boundaries with many a-axis oriented grains of the 123 phase. However, the film on SrTiO3(100) had a smooth surface, and a-axis oriented grains of the 123 phase couldn't be observed

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