Effect of Constant and Cyclic Current Stressing on the Evolution of Intermetallic Compound Layers
暂无分享,去创建一个
[1] William J. Boettinger,et al. Diffusion Parameters and Growth Mechanism of Phases in the Cu-Sn System , 2011 .
[2] Tomi Laurila,et al. Impurity and alloying effects on interfacial reaction layers in Pb-free soldering , 2010 .
[3] Tomi Laurila,et al. Effect of Ag, Fe, Au and Ni on the growth kinetics of Sn-Cu intermetallic compound layers , 2009, Microelectron. Reliab..
[4] Xuefeng Zhang,et al. Recent advances on kinetic analysis of electromigration enhanced intermetallic growth and damage formation in Pb-free solder joints , 2009, Microelectron. Reliab..
[5] T. Laurila,et al. Solid-State Reactions between Cu(Ni) Alloys and Sn , 2007 .
[6] Kimihiro Yamanaka,et al. Studies on solder bump electromigration in Cu/Sn-3Ag-0.5Cu/Cu system , 2007, Microelectron. Reliab..
[7] Jue Li,et al. Evolution of microstructure and failure mechanism of lead-free solder interconnections in power cycling and thermal shock tests , 2007, Microelectron. Reliab..
[8] Paul S. Ho,et al. Investigation of diffusion and electromigration parameters for Cu–Sn intermetallic compounds in Pb-free solders using simulated annealing , 2007 .
[9] K. Suganuma,et al. Electromigration effect on solder bump in Cu/Sn–3Ag–0.5Cu/Cu system , 2006 .
[10] Y. L. Lin,et al. Local melting induced by electromigration in flip-chip solder joints , 2006 .
[11] Sinn-wen Chen,et al. Electromigration effects upon interfacial reactions , 2003 .
[12] Sinn-wen Chen,et al. Electromigration effect upon the Sn–0.7 wt% Cu/Ni and Sn–3.5 wt% Ag/Ni interfacial reactions , 2001 .
[13] A. Lodder,et al. Theory for the electromigration wind force in dilute alloys , 1997, cond-mat/9710072.
[14] P. Ho,et al. Electromigration in metals , 1989 .
[15] M. Ohring,et al. Tracer study of diffusion and electromigration in thin tin films , 1984 .
[16] King-Ning Tu,et al. Kinetics of interfacial reaction in bimetallic CuSn thin films , 1982 .
[17] King-Ning Tu,et al. Interdiffusion and Reaction in Bimetallic Cu-Sn Thin Films , 1973 .
[18] David Turnbull,et al. Interstitial Diffusion of Copper in Tin , 1967 .