论文信息 - Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy - 字舞流文

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

David B. Williams | David B. Williams | David C. Joy | A. D. Romig | Patrick Echlin | Eric Lifshin | Charles E. Lyman | Joseph I. Goldstein | Dale E. Newbury | Charles E. Fiori | Klaus-Ruediger Peters | Alton D. Romig | John T. Armstrong | P. Echlin | J. Armstrong | D. Joy | D. Newbury | E. Lifshin | J. Goldstein | C. Lyman | K. Peters | C. Fiori

[1] M. Benjamin,et al. Basic Techniques for Transmission Electron Microscopy. , 1990 .

[2] L. Samuels,et al. Metallographic polishing by mechanical methods , 1982 .

[3] M. A. Hayat,et al. Fixation for Electron Microscopy , 1982 .

[4] Ingar F. Walder,et al. Economic Geology , 1926, Nature.

[5] W. Kopp,et al. Anschliff- und Dünnschliff-Präparation von Kunststoffen / Preparation of Polished Specimens and Thin Sections of Plastics , 1980 .

[6] W. Tegart,et al. The electrolytic and chemical polishing of metals in research and industry , 1956 .