On the reliability of powder diffraction Line Profile Analysis of plastically deformed nanocrystalline systems
暂无分享,去创建一个
Luca Rebuffi | Elvio Carlino | Paolo Scardi | Regina Ciancio | Andrea Troian | Amine Amimi | Alberto Leonardi | P. Scardi | A. Troian | E. Carlino | L. Rebuffi | A. Leonardi | R. Ciancio | Amine Amimi
[1] Andrzej Litewka. Advanced Materials and Structures for Extreme Operating Conditions , 2008 .
[2] Toshio Suzuki,et al. Plastic anisotropy in b.c.c. transition metals , 1997 .
[3] J. Cohen,et al. Diff raction f rom Materials , 2006 .
[4] R. Guinebretière. X-ray Diffraction by Polycrystalline Materials: Guinebretière/X-ray , 2010 .
[5] J. Bonevich,et al. Crystalline domain size and faulting in the new NIST SRM 1979 zinc oxide , 2013, Powder Diffraction.
[6] Toward a reference material for line profile analysis , 2014, Powder Diffraction.
[7] Grain size distribution of nanocrystalline systems , 2005, Powder Diffraction.
[8] E. N. Maslen. X-ray absorption , 2006 .
[9] P. Scardi,et al. Dislocation Effects on the Diffraction Line Profiles from Nanocrystalline Domains , 2016, Metallurgical and Materials Transactions A.
[10] H. Amenitsch,et al. First performance assessment of the small-angle X-ray scattering beamline at ELETTRA. , 1998, Journal of synchrotron radiation.
[11] P. Scardi,et al. Diffraction line profiles from polydisperse crystalline systems. , 2001, Acta crystallographica. Section A, Foundations of crystallography.
[12] P. Scardi,et al. Annealing Behavior of a Nanostructured Fe1.5Mo Alloy , 2012, Metallurgical and Materials Transactions A.
[13] E. J. Mittemeijer,et al. Diffraction analysis of the microstructure of materials , 2004 .
[14] Steve Plimpton,et al. Fast parallel algorithms for short-range molecular dynamics , 1993 .
[15] Michael E. Fitzpatrick,et al. Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation , 2003 .
[16] R. Snyder,et al. Defect and Microstructure Analysis by Diffraction , 2000 .
[17] N. Ashcroft,et al. Vegard's law. , 1991, Physical review. A, Atomic, molecular, and optical physics.
[18] K. T. Ramesh,et al. Nanomaterials: Mechanics and Mechanisms , 2009 .
[19] Alexey E. Romanov,et al. Random Disclination Ensembles in Ultrafine-Grained Materials Produced by Severe Plastic Deformation , 1996 .
[20] Sidney Yip,et al. Molecular dynamics simulations of motion of edge and screw dislocations in a metal , 2002 .
[21] P. Scardi,et al. High-energy grinding of FeMo powders , 2007 .
[22] G. Langlet,et al. International Tables for Crystallography , 2002 .
[23] P. Scardi,et al. Strain in atomistic models of nanocrystalline clusters. , 2012, Journal of nanoscience and nanotechnology.
[24] P. Scardi,et al. Realistic nano-polycrystalline microstructures: beyond the classical Voronoi tessellation , 2012 .
[25] X. D. Liu,et al. The lattice expansion in nanometre-sized Ni polycrystals , 1994 .
[26] H. V. Swygenhoven,et al. Grain Boundaries and Dislocations , 2002 .
[27] John Arthur Simmons,et al. FUNDAMENTAL ASPECTS OF DISLOCATION THEORY. VOLUME II. Conference Held at Gaithersburg, Maryland, April 21--25, 1969. , 1970 .
[28] Mark R. Gilbert,et al. Edge dislocation mobilities in bcc Fe obtained by molecular dynamics , 2011 .
[29] L. Vegard,et al. Die Konstitution der Mischkristalle und die Raumfüllung der Atome , 1921 .
[30] Tamar Frankel. [The theory and the practice...]. , 2001, Tijdschrift voor diergeneeskunde.
[31] B. Warren,et al. The Separation of Stacking Fault Broadening in Cold‐Worked Metals , 1952 .
[32] Peter M. Derlet,et al. Calculation of x-ray spectra for nanocrystalline materials , 2005 .
[33] Luca Rebuffi,et al. MCX: a Synchrotron Radiation Beamline for X‐ray Diffraction Line Profile Analysis , 2014 .
[34] M. Wilkens. The determination of density and distribution of dislocations in deformed single crystals from broadened X‐ray diffraction profiles , 1970 .
[35] H. V. Swygenhoven,et al. Deformation in nanocrystalline metals , 2006 .
[36] P. Scardi,et al. Line profile analysis: pattern modelling versus profile fitting , 2006 .
[37] P. Scardi,et al. Common volume functions and diffraction line profiles of polyhedral domains , 2012 .
[38] René Guinebretière,et al. X-Ray Diffraction by Polycrystalline Materials , 2007 .
[39] T. Hahn. International tables for crystallography , 2002 .
[40] P. Scardi,et al. Whole powder pattern modelling. , 2002, Acta crystallographica. Section A, Foundations of crystallography.
[41] B. Warren,et al. The Effect of Cold‐Work Distortion on X‐Ray Patterns , 1950 .
[42] A. Molinari,et al. Role of lattice strain on thermal stability of a nanocrystalline FeMo alloy , 2010 .
[43] S. Bass,et al. Constituent quarks and g1 , 1999, hep-ph/9902280.
[44] Seungwu Han,et al. Development of new interatomic potentials appropriate for crystalline and liquid iron , 2003 .
[45] P. Debye,et al. Zerstreuung von Röntgenstrahlen , 1915 .
[46] M. Baskes,et al. Embedded-atom method: Derivation and application to impurities, surfaces, and other defects in metals , 1984 .
[47] K. Jacobsen,et al. A Maximum in the Strength of Nanocrystalline Copper , 2003, Science.
[48] P. Scardi,et al. Atomistic modelling of polycrystalline microstructures: An evolutional approach to overcome topological restrictions , 2013 .
[49] J. Langford,et al. Scherrer after sixty years: a survey and some new results in the determination of crystallite size , 1978 .
[50] P. Scardi,et al. Directional pair distribution function for diffraction line profile analysis of atomistic models , 2013, Journal of applied crystallography.
[51] D. Balzar,et al. Size–strain line-broadening analysis of the ceria round-robin sample , 2004 .
[52] K. Lonsdale. X-Ray Diffraction , 1971, Nature.