Effect of elastic modulus of PMMA films on its machinability by AFM-based nanoscratching method
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[1] J. Sader,et al. Calibration of rectangular atomic force microscope cantilevers , 1999 .
[2] William D. Nix,et al. Effects of the substrate on the determination of thin film mechanical properties by nanoindentation , 2002 .
[3] H. Schönherr,et al. Substrate effect and application of the elastic foundation model to evaluate atomic force microscope nanoindentations of thin polymeric films , 2011 .
[4] I. Sung,et al. Nano-scale patterning by mechano-chemical scanning probe lithography , 2005 .
[5] Dae-Eun Kim,et al. Measurement of the elastic modulus of polymeric films using an AFM with a steel micro-spherical probe tip , 2012 .
[6] Heinz Sturm,et al. Dynamic plowing nanolithography on polymethylmethacrylate using an atomic force microscope , 2001 .
[7] Heh-Nan Lin,et al. Fabrication of metal nanowires by atomic force microscopy nanoscratching and lift-off process , 2005 .
[8] D. Bodas,et al. Comparative study of spin coated and sputtered PMMA as an etch mask material for silicon micromachining , 2005 .
[9] Jee-Gong Chang,et al. Machining characterization of the nano-lithography process using atomic force microscopy , 2000 .
[10] Shinya Sasaki,et al. Elastic modulus of polystyrene film from near surface to bulk measured by nanoindentation using atomic force microscopy , 2006 .
[11] R. Glang,et al. Handbook of Thin Film Technology , 1970 .