Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818]
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Bharat Bhushan | Fabio Coccetti | George J. Papaioannou | Robert Plana | Patrick Pons | Usama Zaghloul