Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818]

1. T1. The updated e-mail address for the corresponsding author is ‘usama.zaghloul@ieee.org’ instead of ‘usama.zaghloul@laas.fr’ 2. In page number 1812: 2nd paragraph: The sentence reads ‘Force–distance curve measurements were used to measure the adhesive force between the AFM tip and the dielectric film [13]. The ‘Ref’ has to be removed. 3. In page 1813: Section 4: in Sentence ‘Then the force–distance curve measurements were applied to measure the adhesive force in different positions over the charged dielectric film’, the word ‘then should be replaced to ‘Next’. 4. In page 1815: Under figure 6: Sentence 4: Please insert ‘at’ before ‘larger’.