Accurate experimental characterization of three-ports

An accurate procedure is reported for experimentally characterizing microwave devices using two-port measurements. Only reflection measurements are used to determine three-port reflection parameters, and transmission measurements are primarily used to determine three-port transmission parameters, thus considerably reducing the sensitivity of the procedure. No assumptions about the three-port device are made. A comparison with the renormalization method of D. Woods (1977) was made using a microstrip tee, and an improvement in accuracy was confirmed.<<ETX>>

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