Postprocessing of Near-Field Measurement Based on Neural Networks
暂无分享,去创建一个
David Baudry | Anne Louis | Bélahcène Mazari | Mohamed Bensetti | Zouheir Riah | Ryadh Brahimi | Adam Kornaga | D. Baudry | A. Louis | Z. Riah | B. Mazari | M. Bensetti | Ryadh Brahimi | Adam Kornaga
[1] Mohammad Bagher Menhaj,et al. Training feedforward networks with the Marquardt algorithm , 1994, IEEE Trans. Neural Networks.
[2] Caron Green,et al. Non-destructive evaluation using neural networks , 1995 .
[3] Masato Enokizono,et al. Neural network models of eddy current multi-frequency system for nondestructive testing , 2000 .
[4] Kurt Hornik,et al. Multilayer feedforward networks are universal approximators , 1989, Neural Networks.
[5] B. Mazari,et al. Applications of the Near-Field Techniques in EMC Investigations , 2007, IEEE Transactions on Electromagnetic Compatibility.
[6] M. Ribo,et al. A genetic algorithm based method for source identification and far-field radiated emissions prediction from near-field measurements for PCB characterization , 2001 .
[7] J. Schoukens,et al. The interpolated fast Fourier transform: a comparative study , 1991 .
[8] B. Mazari,et al. Overview of emission and susceptibility investigation and modeling with near-field measurements , 2008 .
[9] Lionel Pichon,et al. Characterization of radiated emissions from power electronic devices : synthesis of an equivalent model from near-field measurement , 2007 .
[10] Moncef Kadi,et al. Characterization of electromagnetic fields close to microwave devices using electric dipole probes , 2008 .
[11] R. R. Goulette. The Measurement Of Radiated Emissions From Integrated Circuits , 1992, International Symposium on Electromagnetic Compatibility.
[12] F. Lafon,et al. Prediction of the field radiated at one meter from PCB's and microprocessors from near EM field cartography , 2003, 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03..
[13] S. Bendhia,et al. Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan , 2007 .
[14] Stavros M. Panas,et al. Impedance inversion in eddy current testing of layered planar structures via neural networks , 1997 .
[15] D. Baudry,et al. Near-field techniques for detecting EMI sources , 2004, 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559).
[16] S. Criel,et al. Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems , 1996, Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Tec.
[17] B. Mazari,et al. Modeling Magnetic Radiations of Electronic Circuits Using Near-Field Scanning Method , 2007, IEEE Transactions on Electromagnetic Compatibility.