Effect of annealing on the properties of indium-tin-oxynitride films as ohmic contacts for gan-based optoelectronic devices.
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J. Schaefer | S. Krischok | M. Modreanu | V. Cimalla | E. Aperathitis | G. Ecke | N. Pelekanos | M. Koufaki | M. Himmerlich | C. Mauder | A. Kondilis