论文信息 - Localized Damage in AlGaN/GaN HEMTs Induced by Reverse-Bias Testing - 字舞流文

Localized Damage in AlGaN/GaN HEMTs Induced by Reverse-Bias Testing

M. Meneghini | G. Meneghesso | M. Peroni | C. Lanzieri | E. Zanoni | A. Cetronio | F. Danesin