论文信息 - On the Limits of Scalpel AFM for the 3D Electrical Characterization of Nanomaterials - 字舞流文

On the Limits of Scalpel AFM for the 3D Electrical Characterization of Nanomaterials

M. Lanza | F. Hui | M. Rommel | A. Kenyon | Yuanyuan Shi | X. Jing | Shaochuan Chen | Yanfeng Ji | M. Buckwell | A. Mehonic | Lanlan Jiang | A. Paskaleva | W. H. Ng | G. Benstetter | E. Grustan-gutierrez | W. Ng