Step-stress accelerated degradation test modeling and statistical analysis methods

In order to get a rapid assessment on the storage reliability of high-reliable and long-life products within the storage period, accelerated degradation test data with a large amount of reliability information of product is adopted. Conducting a constant-stress accelerated degradation test(CSADT) is generally very costly as it requires a large sample size and long time for test. To overcome this problem, it is necessary to carry out research on modeling and statistical analysis methods of step-stress accelerated degradation test (SSADT). Taking electrical connectors as the object, a research is conducted on statistical model and assessment method for SSADT. On the basis of mixed-effect degradation path model, the statistical model of SSADT for electrical connectors is presented, the maximum likelihood method for SSADT data based on mixed-effect degradation model is proposed. SSADT accelerated by temperature stress is conducted to Y11X-1419 type of electrical connectors, and the storage reliability is assessed with the SSADT data. Compared with the result obtained from accelerated life test, the reliability estimation of 32-year storage period for electrical connectors obtained from SSADT data only have a difference of 0.869%, which validates the accuracy of the degradation model and the feasibility of the test data statistic analysis method put forward.

[1]  Luis A. Escobar,et al.  Accelerated degradation tests: modeling and analysis , 1998 .

[2]  Jiang Tong-min.  Constant-stress Accelerated Degradation Testing of Satellite Assemblies , 2007 .

[3]  Wayne Nelson,et al.  Analysis of Performance-Degradation Data from Accelerated Tests , 1981, IEEE Transactions on Reliability.

[4]  W. J. Padgett,et al.  Accelerated Degradation Models for Failure Based on Geometric Brownian Motion and Gamma Processes , 2005, Lifetime data analysis.

[5]  Xun Chen.  Research, Application and Development of Accelerated Testing , 2009 .

[6]  Gao,et al.  Accelerated Degradation Reliability Modeling and Test Data Statistical Analysis of Aerospace Electrical Connector , 2011 .

[7]  Hong-Fwu Yu,et al.  Designing an accelerated degradation experiment with a reciprocal Weibull degradation rate , 2006 .

[8]  W. Meeker.  Accelerated Testing: Statistical Models, Test Plans, and Data Analyses , 1991 .

[9]  Jiming Ma.  Performance Reliability Analysis of a Piston Pump Affected by Random Degradation , 2010 .

[10]  Zhaobin Wang,et al.  Study on feasibility of storage accelerated testing based on parameter degradation for aerospace relays , 2012, Proceedings of the IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing).

[11]  Yong Sun,et al.  A review on degradation models in reliability analysis , 2010, WCE 2010.

[12]  Cai Jin-yan.  Reliability Assessment of Radar Power Supply Device based on Accelerated Performance Degradation , 2010 .

[13]  Suk Joo Bae,et al.  Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation Tests , 2010, IEEE Transactions on Reliability.

[14]  Zhaobin Wang,et al.  Research on Accelerated Storage Degradation Testing for Aerospace Electromagnetic Relay , 2012, 2012 IEEE 58th Holm Conference on Electrical Contacts (Holm).

[15]  Wang Ya-shun.  A Comprehensive Review of Accelerated Degradation Testing , 2007 .

[16]  Xiaodong Ruan.  Simulation and Experiment Research on Vortex Non-contact Wafer Holder , 2010 .

[17]  Xun Chen,et al.  Simulation-based optimal design for accelerated degradation tests , 2009, 2009 8th International Conference on Reliability, Maintainability and Safety.

[18]  Chanseok Park,et al.  Stochastic degradation models with several accelerating variables , 2006, IEEE Transactions on Reliability.

[19]  Hong-Fwu Yu,et al.  Designing an accelerated degradation experiment by optimizing the estimation of the percentile , 2003 .

[20]  Jae-Han Jung,et al.  A study on the lifetime comparison for Electric Double Layer Capacitors using Accelerated Degradation Test , 2011, 2011 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering.

[21]  S. Tseng,et al.  Step-Stress Accelerated Degradation Analysis for Highly Reliable Products , 2000 .

[22]  M. Boulanger,et al.  Experimental Design for a Class of Accelerated Degradation Tests , 1994 .

[23]  M.-T. Chao,et al.  DEGRADATION ANALYSIS AND RELATED TOPICS : SOME THOUGHTS AND A REVIEW , 1999 .

[24]  Hong-Fwu Yu,et al.  DESIGNING AN ACCELERATED DEGRADATION EXPERIMENT BY OPTIMIZING THE INTERVAL ESTIMATION OF THE MEAN-TIME-TO-FAILURE , 2002 .