论文信息 - Correlation between EOS customer return failure cases and Over Voltage Stress (OVS) test method

Correlation between EOS customer return failure cases and Over Voltage Stress (OVS) test method

Abstract For the last 30 years, the electronic industry made many efforts to reduce ESD failure rates. Consequently EOS failure rate can be the dominant one. Concerned by zero defect program and EOS failure rate from customer complaints, NXP Semiconductors defined a new test method called Over Voltage Stress (OVS) that is able to reproduce EOS failure, to define product Absolute Maximum Ratings (AMR) and also to improve IC robustness against EOS events.

Christian Gautier | Jean Luc Lefebvre | Frédéric Barbier

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