Cyclotron Resonance Linewidth in a Two‐Dimensional Electron Gas

Cyclotron resonance linewidths due to scattering by phonons and alloy disorder are calculated for a two-dimensional electron gas formed in a heterojunction. The expression of linewidth for scattering due to acoustic phonons via deformation potential and piezoelectric interaction and for alloy scattering is obtained by including the finite extent of the wavefunction along the direction of quantisation. The screening due to free carriers is considered for electron–phonon interaction. The calculated linewidths for scattering due to deformation potential accoustic phonon and alloy scattering show a B1/2 variation and a weaker field dependence is obtained for piezoelectric scattering. Fur ein zweidimensionales Elektronengas in einem Heteroubergang werden die durch Phononenstreuung und Legierungsfehlordnung hervorgerufenen Zyklotronresonanzlinienbreiten berechnet. Die Ausdrucke fur die Linienbreite infolge Streuung durch akustische Phononen uber das Deformationspotential und piezoelektrische Wechselwirkung und fur Legierungsstreuung werden durch Einbeziehung der endlichen Ausdehnung der Wellenfunktion in Quantisierungsrichtung erhalten. Die Abschirmung durch freie Ladungstrager wird durch Elektron–Phonon-Wechselwirkungen berucksichtigt. Die berechnete Linienbreite fur Streuung akustischer Phononen am Deformationspotential und fur Legierungsstreuung zeigt eine B1/2-Variation, und es wird eine schwachere Abhangigkeit als fur piezoelektrische Streuung gefunden.

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