"RADON-5E" portable pulsed laser simulator: description, qualification technique and results, dosimetry procedure
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A. N. Egorov | A. Y. Nikiforov | O. B. Mavritsky | V. S. Figurov | V. A. Telets | P. K. Skorobogatov | S. A. Polevich | A. Nikiforov | O.B. Mavritsky | V.S. Figurov | V.A. Telets | P.K. Skorobogatov | S.A. Polevich
[1] D. Habing. The Use of Lasers to Simulate Radiation-Induced Transients in Semiconductor Devices and Circuits , 1965 .
[2] T. Ellis,et al. Use of a Pulsed Laser as an Aid to Transient Upset Testing of I2L LSI Microcircuits , 1978, IEEE Transactions on Nuclear Science.
[3] Mary Ann Hardman,et al. Exploitation of a Pulsed Laser to Explore Transient Effects on Semiconductor Devices , 1984, IEEE Transactions on Nuclear Science.
[4] S. Buchner,et al. Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies , 1994 .
[5] E. E. King,et al. The Hardness Assurance Wafer Probe - HAWP , 1983, IEEE Transactions on Nuclear Science.
[6] A. Johnston. Charge generation and collection in p-n junctions excited with pulsed infrared lasers , 1993 .
[7] A. H. Johnston,et al. Experimental Methods for Determining Latchup Paths in Integrated Circuits , 1985, IEEE Transactions on Nuclear Science.
[8] I. V. Poljakov,et al. Test CMOS/SOS RAM for transient radiation upset comparative research and failure analysis , 1995 .
[9] A. Y. Nikiforov,et al. CMOS IC transient radiation effects investigations, model verification and parameter extraction with the test structures laser simulation tests , 1996, Proceedings of International Conference on Microelectronic Test Structures.
[10] W. D. Raburn,et al. Comparison of threshold transient upset levels induced by flash X-rays and pulsed lasers , 1988 .
[11] A. H. Johnston,et al. Mechanisms for the Latchup Window Effect in Integrated Circuits , 1985, IEEE Transactions on Nuclear Science.
[12] F. Junga,et al. An Investigation of the Transient Ionizing Radiation Response of Diffused Resistors Using a Pulsed Laser , 1980, IEEE Transactions on Nuclear Science.
[13] A. H. Johnston,et al. Latchup Paths in Bipolar Integrated Circuits , 1986, IEEE Transactions on Nuclear Science.
[14] E. E. King,et al. Transient Radiation Screening of Silicon Devices Using Backside Laser Irradiation , 1982, IEEE Transactions on Nuclear Science.