Reliability functions estimated from commonly used yield models

Reliability can be estimated from a semiconductor yield model once in-process measurements of manufacturing defects are obtained which cause both yield and reliability losses. Such reliability is more useful, than reliability estimated from field failure data, for determining during the early production stage whether a reliability requirement will be met or not. The purpose of this paper is to investigate and compare reliability functions estimated from previous yield models that are commonly used in literature. The results characterize the impact of defect clustering and environmental conditions on reliability estimated from yield.

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