论文信息 - The use of an optically trapped microprobe for scanning details of surface

The use of an optically trapped microprobe for scanning details of surface

We present two methods for surface profiles measurement using optically trapped probe in tightly focused laser beam (optical tweezers). The first method is based on a continuous contact of the probe with the surface (contact mode) and the second one employes the alternating contact (tapping mode). The probe deviations are detected by two-photon fluorescence excited by the trapping beam and emitted by the trapped dyed probe.

[1] H. Rubinsztein-Dunlop,et al. Three-dimensional imaging with optical tweezers. , 1999, Applied optics.

[2] E. Stelzer,et al. Photonic force microscope based on optical tweezers and two-photon excitation for biological applications. , 1997, Journal of structural biology.

[3] E. Stelzer,et al. High‐resolution axial and lateral position sensing using two‐photon excitation of fluorophores by a continuous‐wave Nd:YAG laser , 1996 .

[4] S. Chu,et al. Observation of a single-beam gradient force optical trap for dielectric particles. , 1986, Optics letters.

[5] E. Stelzer,et al. Three‐dimensional high‐resolution particle tracking for optical tweezers by forward scattered light , 1999, Microscopy research and technique.